::::: 해피통상 :::::
공지사항
자유게시판
제품문의

 

 

 

 

 

 

8 , 1
htgood_com    2005-12-21 22:34:53   
MAIN SEMICONDUCTOR PROBING SYSTEM  


Main semiconductor probing system

It is clearly stipulated that the manufacturing process of semiconductor can be largely divided into four main parts such as Fabrication, Water Test, Assembly and Package Test. The probe station, key product line of the company, is a system used in the wafer test process in sorting out defective products in each chip at the wafer and in analyzing characteristics along with the Tester.

According to the distinguishing criteria Prober can be categorized as: analysis or mass-production purpose; and manual, semi-automatic or automatic.

In recent years, as the center of gravity has been switched to 300mm Wafer, semiconductor inspection system companies in the advanced countries have strived to develop systems in response to this change. However, domestic semiconductor inspection system makers still lag far behind in terms of the technical edge. Therefore, the government has selected the industry as one of the promising future industries and pours concentrated efforts to promote this field.

Since the company secured exclusive sales rights of probers and testers from US Signatone and Japanese EPOS in the Korea and China, it has provided cutting-edge semiconductor inspection systems in the right time. While accumulating the know-how of the advanced technologies through the refurbishments of products of US Electroglas, Japanese Tokyo Electron, etc., the company is fully devoted to develop its own brands based on technologies created from its tech. research center.




Copyright 1999-2019 Zeroboard